True-color 3D surface metrology for additive manufacturing using interference microscopy

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True-color 3D surface metrology for additive manufacturing using interference microscopy

Coherence scanning interferometry (CSI) is widely used for surface topography characterisation. With the ability to measure both rough surfaces with the high slopes and optical finishes, CSI has made contibutions in fields from industrial machining to optical fabrication and polishing [1,2]. While t...

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Bibliographic Details
Main Authors:	DiSciacca, Jack, Gomez, Carlos, Thompson, Adam, Lawes, Simon, Leach, Richard, Colonna de Lega, Xavier, de Groot, Peter
Format:	Conference or Workshop Item
Published:	2017
Online Access:	https://eprints.nottingham.ac.uk/48598/

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