DiSciacca, J., Gomez, C., Thompson, A., Lawes, S., Leach, R., Colonna de Lega, X., & de Groot, P. (2017). True-color 3D surface metrology for additive manufacturing using interference microscopy.
Chicago Style (17th ed.) CitationDiSciacca, Jack, Carlos Gomez, Adam Thompson, Simon Lawes, Richard Leach, Xavier Colonna de Lega, and Peter de Groot. True-color 3D Surface Metrology for Additive Manufacturing Using Interference Microscopy. 2017.
MLA (9th ed.) CitationDiSciacca, Jack, et al. True-color 3D Surface Metrology for Additive Manufacturing Using Interference Microscopy. 2017.
Warning: These citations may not always be 100% accurate.