APA (7th ed.) Citation

Oeder, T., Castellazzi, A., & Pfost, M. (2017). Experimental study of the short-circuit performance for a 600V normally-off p-gate GaN HEMT. Institute of Electrical and Electronics Engineers.

Chicago Style (17th ed.) Citation

Oeder, Thorsten, Alberto Castellazzi, and Martin Pfost. Experimental Study of the Short-circuit Performance for a 600V Normally-off P-gate GaN HEMT. Institute of Electrical and Electronics Engineers, 2017.

MLA (9th ed.) Citation

Oeder, Thorsten, et al. Experimental Study of the Short-circuit Performance for a 600V Normally-off P-gate GaN HEMT. Institute of Electrical and Electronics Engineers, 2017.