Quantum dynamics of a Josephson junction driven cavity mode system in the presence of voltage bias noise

We give a semiclassical analysis of the average photon number as well as photon number variance (Fano factor F) for a Josephson junction (JJ) embedded microwave cavity system, where the JJ is subject to a fluctuating (i.e., noisy) bias voltage with finite dc average. Through the ac Josephson effect,...

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Main Authors: Wang, Hui, Blencowe, M.P., Armour, A.D., Rimberg, A.J.
Format: Article
Published: American Physical Society 2017
Online Access:https://eprints.nottingham.ac.uk/45467/
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author Wang, Hui
Blencowe, M.P.
Armour, A.D.
Rimberg, A.J.
author_facet Wang, Hui
Blencowe, M.P.
Armour, A.D.
Rimberg, A.J.
author_sort Wang, Hui
building Nottingham Research Data Repository
collection Online Access
description We give a semiclassical analysis of the average photon number as well as photon number variance (Fano factor F) for a Josephson junction (JJ) embedded microwave cavity system, where the JJ is subject to a fluctuating (i.e., noisy) bias voltage with finite dc average. Through the ac Josephson effect, the dc voltage bias drives the effectively nonlinear microwave cavity mode into an amplitude squeezed state (F <1), as has been established previously [Armour et al., Phys. Rev. Lett. 111, 247001 (2013)], but bias noise acts to degrade this squeezing. We find that the sensitivity of the Fano factor to bias voltage noise depends qualitatively on which stable fixed point regime the system is in for the corresponding classical nonlinear steady-state dynamics. Furthermore, we show that the impact of voltage bias noise is most significant when the cavity is excited to states with large average photon number.
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spelling nottingham-454672024-08-15T15:23:47Z https://eprints.nottingham.ac.uk/45467/ Quantum dynamics of a Josephson junction driven cavity mode system in the presence of voltage bias noise Wang, Hui Blencowe, M.P. Armour, A.D. Rimberg, A.J. We give a semiclassical analysis of the average photon number as well as photon number variance (Fano factor F) for a Josephson junction (JJ) embedded microwave cavity system, where the JJ is subject to a fluctuating (i.e., noisy) bias voltage with finite dc average. Through the ac Josephson effect, the dc voltage bias drives the effectively nonlinear microwave cavity mode into an amplitude squeezed state (F <1), as has been established previously [Armour et al., Phys. Rev. Lett. 111, 247001 (2013)], but bias noise acts to degrade this squeezing. We find that the sensitivity of the Fano factor to bias voltage noise depends qualitatively on which stable fixed point regime the system is in for the corresponding classical nonlinear steady-state dynamics. Furthermore, we show that the impact of voltage bias noise is most significant when the cavity is excited to states with large average photon number. American Physical Society 2017-09-05 Article PeerReviewed Wang, Hui, Blencowe, M.P., Armour, A.D. and Rimberg, A.J. (2017) Quantum dynamics of a Josephson junction driven cavity mode system in the presence of voltage bias noise. Physical Review B, 96 (10). p. 104503. ISSN 2469-9969 https://journals.aps.org/prb/abstract/10.1103/PhysRevB.96.104503 doi:10.1103/PhysRevB.96.104503 doi:10.1103/PhysRevB.96.104503
spellingShingle Wang, Hui
Blencowe, M.P.
Armour, A.D.
Rimberg, A.J.
Quantum dynamics of a Josephson junction driven cavity mode system in the presence of voltage bias noise
title Quantum dynamics of a Josephson junction driven cavity mode system in the presence of voltage bias noise
title_full Quantum dynamics of a Josephson junction driven cavity mode system in the presence of voltage bias noise
title_fullStr Quantum dynamics of a Josephson junction driven cavity mode system in the presence of voltage bias noise
title_full_unstemmed Quantum dynamics of a Josephson junction driven cavity mode system in the presence of voltage bias noise
title_short Quantum dynamics of a Josephson junction driven cavity mode system in the presence of voltage bias noise
title_sort quantum dynamics of a josephson junction driven cavity mode system in the presence of voltage bias noise
url https://eprints.nottingham.ac.uk/45467/
https://eprints.nottingham.ac.uk/45467/
https://eprints.nottingham.ac.uk/45467/