APA (7th ed.) Citation

Oeder, T., Castellazzi, A., & Pfost, M. (2017). Electrical and thermal failure modes of 600 V p-gate GaN HEMTs. Elsevier.

Chicago Style (17th ed.) Citation

Oeder, Thorsten, Alberto Castellazzi, and Martin Pfost. Electrical and Thermal Failure Modes of 600 V P-gate GaN HEMTs. Elsevier, 2017.

MLA (9th ed.) Citation

Oeder, Thorsten, et al. Electrical and Thermal Failure Modes of 600 V P-gate GaN HEMTs. Elsevier, 2017.