Optimizing the structure of scanning probes for atomic manipulation

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Optimizing the structure of scanning probes for atomic manipulation

Scanning probe microscopy (SPM) allows us to directly measure the interactions between a probe and a sample at the atomic scale. Techniques such as non-contact atomic force microscopy (NC-AFM), allows us to to characterize the forces present on a surface, resolve the atomic structure of molecules or...

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Bibliographic Details
Main Author:	Møller, Morten
Format:	Thesis (University of Nottingham only)
Language:	English
Published:	2017
Online Access:	https://eprints.nottingham.ac.uk/44916/

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