Orientation imaging of macro-sized polysilicon grains on wafers using spatially resolved acoustic spectroscopy
Due to its economical production process polysilicon, or multicrystalline silicon, is widely used to produce solar cell wafers. However, the conversion efficiencies are often lower than equivalent monocrystalline or thin film cells, with the structure and orientation of the silicon grains strongly l...
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| Format: | Article |
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Elsevier
2017
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| Online Access: | https://eprints.nottingham.ac.uk/44204/ |
| _version_ | 1848796862046273536 |
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| author | Patel, Rikesh Li, Wenqi Smith, Richard J. Sharples, Steve D. Clark, Matt |
| author_facet | Patel, Rikesh Li, Wenqi Smith, Richard J. Sharples, Steve D. Clark, Matt |
| author_sort | Patel, Rikesh |
| building | Nottingham Research Data Repository |
| collection | Online Access |
| description | Due to its economical production process polysilicon, or multicrystalline silicon, is widely used to produce solar cell wafers. However, the conversion efficiencies are often lower than equivalent monocrystalline or thin film cells, with the structure and orientation of the silicon grains strongly linked to the efficiency. We present a non-destructive laser ultrasonic inspection technique, capable of characterising large (52 x 76 mm2) photocell's microstructure – measurement times, sample surface preparation and system upgrades for silicon scanning are discussed. This system, known as spatially resolved acoustic spectroscopy (SRAS) could be used to optimise the polysilicon wafer production process and potentially improve efficiency. |
| first_indexed | 2025-11-14T19:54:43Z |
| format | Article |
| id | nottingham-44204 |
| institution | University of Nottingham Malaysia Campus |
| institution_category | Local University |
| last_indexed | 2025-11-14T19:54:43Z |
| publishDate | 2017 |
| publisher | Elsevier |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | nottingham-442042020-05-04T19:54:23Z https://eprints.nottingham.ac.uk/44204/ Orientation imaging of macro-sized polysilicon grains on wafers using spatially resolved acoustic spectroscopy Patel, Rikesh Li, Wenqi Smith, Richard J. Sharples, Steve D. Clark, Matt Due to its economical production process polysilicon, or multicrystalline silicon, is widely used to produce solar cell wafers. However, the conversion efficiencies are often lower than equivalent monocrystalline or thin film cells, with the structure and orientation of the silicon grains strongly linked to the efficiency. We present a non-destructive laser ultrasonic inspection technique, capable of characterising large (52 x 76 mm2) photocell's microstructure – measurement times, sample surface preparation and system upgrades for silicon scanning are discussed. This system, known as spatially resolved acoustic spectroscopy (SRAS) could be used to optimise the polysilicon wafer production process and potentially improve efficiency. Elsevier 2017-11-31 Article PeerReviewed Patel, Rikesh, Li, Wenqi, Smith, Richard J., Sharples, Steve D. and Clark, Matt (2017) Orientation imaging of macro-sized polysilicon grains on wafers using spatially resolved acoustic spectroscopy. Scripta Materialia, 140 . pp. 67-70. ISSN 1359-6462 Acoustic methods Solar cells Crystal structure Microstructure Nondestructive testing http://www.sciencedirect.com/science/article/pii/S1359646217303846 doi:10.1016/j.scriptamat.2017.07.003 doi:10.1016/j.scriptamat.2017.07.003 |
| spellingShingle | Acoustic methods Solar cells Crystal structure Microstructure Nondestructive testing Patel, Rikesh Li, Wenqi Smith, Richard J. Sharples, Steve D. Clark, Matt Orientation imaging of macro-sized polysilicon grains on wafers using spatially resolved acoustic spectroscopy |
| title | Orientation imaging of macro-sized polysilicon grains on wafers using spatially resolved acoustic spectroscopy |
| title_full | Orientation imaging of macro-sized polysilicon grains on wafers using spatially resolved acoustic spectroscopy |
| title_fullStr | Orientation imaging of macro-sized polysilicon grains on wafers using spatially resolved acoustic spectroscopy |
| title_full_unstemmed | Orientation imaging of macro-sized polysilicon grains on wafers using spatially resolved acoustic spectroscopy |
| title_short | Orientation imaging of macro-sized polysilicon grains on wafers using spatially resolved acoustic spectroscopy |
| title_sort | orientation imaging of macro-sized polysilicon grains on wafers using spatially resolved acoustic spectroscopy |
| topic | Acoustic methods Solar cells Crystal structure Microstructure Nondestructive testing |
| url | https://eprints.nottingham.ac.uk/44204/ https://eprints.nottingham.ac.uk/44204/ https://eprints.nottingham.ac.uk/44204/ |