Three-dimensional time-of-flight secondary ion mass spectrometry imaging of primary neuronal cell cultures

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Three-dimensional time-of-flight secondary ion mass spectrometry imaging of primary neuronal cell cultures

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) has proven its ability to characterise (in)organic surfaces, and is increasingly used for the characterisation of biological samples such as single cells. By combining ion imaging and molecular depth profiling it is possible to render 3D chem...

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Bibliographic Details
Main Author:	Van Nuffel, Sebastiaan
Format:	Thesis (University of Nottingham only)
Language:	English
Published:	2017
Online Access:	https://eprints.nottingham.ac.uk/39644/

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