A thermal cycling reliability study of ultrasonically bonded copper wires

In this work we report on a reliability investigation regarding heavy copper wires ultrasonically bonded onto active braze copper substrates. The results obtained from both a non-destructive approach using 3D X-ray tomography and shear tests showed no discernible degradation or wear out from initial...

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Main Authors: Arjmand, Elaheh, Agyakwa, Pearl A., Corfield, Martin R., Li, Jianfeng, Mouawad, Bassem, Mark Johnson, C.
Format: Article
Published: Elsevier 2016
Subjects:
Online Access:https://eprints.nottingham.ac.uk/37320/
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author Arjmand, Elaheh
Agyakwa, Pearl A.
Corfield, Martin R.
Li, Jianfeng
Mouawad, Bassem
Mark Johnson, C.
author_facet Arjmand, Elaheh
Agyakwa, Pearl A.
Corfield, Martin R.
Li, Jianfeng
Mouawad, Bassem
Mark Johnson, C.
author_sort Arjmand, Elaheh
building Nottingham Research Data Repository
collection Online Access
description In this work we report on a reliability investigation regarding heavy copper wires ultrasonically bonded onto active braze copper substrates. The results obtained from both a non-destructive approach using 3D X-ray tomography and shear tests showed no discernible degradation or wear out from initial conditions to 2900 passive thermal cycles from − 55 to 125 °C. Instead, an apparent increase in shear strength is observed as the number of thermal cycles increases. Nanoindentation hardness investigations suggest the occurrence of cyclic hardening. Microstructural investigations of the interfacial morphologies before and after cycling and after shear testing are also presented and discussed.
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spelling nottingham-373202020-05-04T20:03:04Z https://eprints.nottingham.ac.uk/37320/ A thermal cycling reliability study of ultrasonically bonded copper wires Arjmand, Elaheh Agyakwa, Pearl A. Corfield, Martin R. Li, Jianfeng Mouawad, Bassem Mark Johnson, C. In this work we report on a reliability investigation regarding heavy copper wires ultrasonically bonded onto active braze copper substrates. The results obtained from both a non-destructive approach using 3D X-ray tomography and shear tests showed no discernible degradation or wear out from initial conditions to 2900 passive thermal cycles from − 55 to 125 °C. Instead, an apparent increase in shear strength is observed as the number of thermal cycles increases. Nanoindentation hardness investigations suggest the occurrence of cyclic hardening. Microstructural investigations of the interfacial morphologies before and after cycling and after shear testing are also presented and discussed. Elsevier 2016-04 Article PeerReviewed Arjmand, Elaheh, Agyakwa, Pearl A., Corfield, Martin R., Li, Jianfeng, Mouawad, Bassem and Mark Johnson, C. (2016) A thermal cycling reliability study of ultrasonically bonded copper wires. Microelectronics Reliability, 59 . pp. 126-133. ISSN 0026-2714 Heavy copper wire bonding; Reliability; Power electronics; Passive thermal cycling; Hardness http://www.sciencedirect.com/science/article/pii/S0026271416300099 doi:10.1016/j.microrel.2016.01.009 doi:10.1016/j.microrel.2016.01.009
spellingShingle Heavy copper wire bonding; Reliability; Power electronics; Passive thermal cycling; Hardness
Arjmand, Elaheh
Agyakwa, Pearl A.
Corfield, Martin R.
Li, Jianfeng
Mouawad, Bassem
Mark Johnson, C.
A thermal cycling reliability study of ultrasonically bonded copper wires
title A thermal cycling reliability study of ultrasonically bonded copper wires
title_full A thermal cycling reliability study of ultrasonically bonded copper wires
title_fullStr A thermal cycling reliability study of ultrasonically bonded copper wires
title_full_unstemmed A thermal cycling reliability study of ultrasonically bonded copper wires
title_short A thermal cycling reliability study of ultrasonically bonded copper wires
title_sort thermal cycling reliability study of ultrasonically bonded copper wires
topic Heavy copper wire bonding; Reliability; Power electronics; Passive thermal cycling; Hardness
url https://eprints.nottingham.ac.uk/37320/
https://eprints.nottingham.ac.uk/37320/
https://eprints.nottingham.ac.uk/37320/