In-situ fabrication of gold nanoparticle functionalized probes for tip-enhanced Raman spectroscopy by dielectrophoresis

We report the use of dielectrophoresis to fabricate in-situ probes for tip-enhanced Raman spectroscopy (TERS) based on Au nanoparticles. A typical conductive atomic force microscope (AFM) was used to functionalize iridium-coated conductive silicon probes with Au nanoparticles of 10-nm diameter. Suit...

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Bibliographic Details
Main Authors: Sweetenham, Claire Sue, Woolley, Richard, Notingher, Ioan
Format: Article
Published: Society of Photo-optical Instrumentation Engineers 2016
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Online Access:https://eprints.nottingham.ac.uk/36186/

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