Quadrature wavelength scanning interferometry

A novel method to double the measurement range of wavelength scanning interferometry (WSI) is described. In WSI the measured optical path difference (OPD) is affected by a sign ambiguity, i.e. from an interference signal it is not possible to distinguish whether the OPD is positive or negative. The...

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Main Authors: Moschetti, Giuseppe, Forbes, Alistair, Leach, Richard K., Jiang, Xiang, O’Connor, Daniel
Format: Article
Published: Optical Society of America 2016
Online Access:https://eprints.nottingham.ac.uk/35132/
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author Moschetti, Giuseppe
Forbes, Alistair
Leach, Richard K.
Jiang, Xiang
O’Connor, Daniel
author_facet Moschetti, Giuseppe
Forbes, Alistair
Leach, Richard K.
Jiang, Xiang
O’Connor, Daniel
author_sort Moschetti, Giuseppe
building Nottingham Research Data Repository
collection Online Access
description A novel method to double the measurement range of wavelength scanning interferometry (WSI) is described. In WSI the measured optical path difference (OPD) is affected by a sign ambiguity, i.e. from an interference signal it is not possible to distinguish whether the OPD is positive or negative. The sign ambiguity can be resolved by measuring an interference signal in quadrature. A method to obtain a quadrature interference signal for WSI is described and a theoretical analysis of the advantages is reported. Simulations of the advantages of the technique and of signal errors due to non-ideal quadrature are discussed. The analysis and simulation are supported by experimental measurements to show the improved performances.
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spelling nottingham-351322020-05-04T18:03:20Z https://eprints.nottingham.ac.uk/35132/ Quadrature wavelength scanning interferometry Moschetti, Giuseppe Forbes, Alistair Leach, Richard K. Jiang, Xiang O’Connor, Daniel A novel method to double the measurement range of wavelength scanning interferometry (WSI) is described. In WSI the measured optical path difference (OPD) is affected by a sign ambiguity, i.e. from an interference signal it is not possible to distinguish whether the OPD is positive or negative. The sign ambiguity can be resolved by measuring an interference signal in quadrature. A method to obtain a quadrature interference signal for WSI is described and a theoretical analysis of the advantages is reported. Simulations of the advantages of the technique and of signal errors due to non-ideal quadrature are discussed. The analysis and simulation are supported by experimental measurements to show the improved performances. Optical Society of America 2016-07-06 Article PeerReviewed Moschetti, Giuseppe, Forbes, Alistair, Leach, Richard K., Jiang, Xiang and O’Connor, Daniel (2016) Quadrature wavelength scanning interferometry. Applied Optics, 55 (20). pp. 5332-5340. ISSN 2155-3165 https://www.osapublishing.org/ao/abstract.cfm?uri=ao-55-20-5332 doi:10.1364/AO.55.005332 doi:10.1364/AO.55.005332
spellingShingle Moschetti, Giuseppe
Forbes, Alistair
Leach, Richard K.
Jiang, Xiang
O’Connor, Daniel
Quadrature wavelength scanning interferometry
title Quadrature wavelength scanning interferometry
title_full Quadrature wavelength scanning interferometry
title_fullStr Quadrature wavelength scanning interferometry
title_full_unstemmed Quadrature wavelength scanning interferometry
title_short Quadrature wavelength scanning interferometry
title_sort quadrature wavelength scanning interferometry
url https://eprints.nottingham.ac.uk/35132/
https://eprints.nottingham.ac.uk/35132/
https://eprints.nottingham.ac.uk/35132/