APA (7th ed.) Citation

Li, J., Castellazzi, A., Dai, T., Corfield, M., Solomon, A. K., & Johnson, C. M. (2015). Built-in reliability design of highly integrated solid-state power switches with metal bump interconnects. IEEE.

Chicago Style (17th ed.) Citation

Li, Jianfeng, Alberto Castellazzi, Tianxiang Dai, Martin Corfield, Adane Kassa Solomon, and Christopher Mark Johnson. Built-in Reliability Design of Highly Integrated Solid-state Power Switches with Metal Bump Interconnects. IEEE, 2015.

MLA (9th ed.) Citation

Li, Jianfeng, et al. Built-in Reliability Design of Highly Integrated Solid-state Power Switches with Metal Bump Interconnects. IEEE, 2015.