Imaging of crystalline and amorphous surface regions using time-of-flight secondary-ion mass spectrometry (ToF-SIMS): application to pharmaceutical materials

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Imaging of crystalline and amorphous surface regions using time-of-flight secondary-ion mass spectrometry (ToF-SIMS): application to pharmaceutical materials

The structure of a material, in particular the extremes of crystalline and amorphous forms, significantly impacts material performance in numerous sectors such as semiconductors, energy storage, and pharmaceutical products, which are investigated in this paper. To characterize the spatial distributi...

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Bibliographic Details
Main Authors:	Iuras, Andrea, Scurr, David J., Boissier, Catherine, Nicholas, Mark L., Roberts, Clive J., Alexander, Morgan R.
Format:	Article
Published:	American Chemical Society 2016
Online Access:	https://eprints.nottingham.ac.uk/32837/

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