APA (7th ed.) Citation

Iuras, A., Scurr, D. J., Boissier, C., Nicholas, M. L., Roberts, C. J., & Alexander, M. R. (2016). Imaging of crystalline and amorphous surface regions using time-of-flight secondary-ion mass spectrometry (ToF-SIMS): Application to pharmaceutical materials. American Chemical Society.

Chicago Style (17th ed.) Citation

Iuras, Andrea, David J. Scurr, Catherine Boissier, Mark L. Nicholas, Clive J. Roberts, and Morgan R. Alexander. Imaging of Crystalline and Amorphous Surface Regions Using Time-of-flight Secondary-ion Mass Spectrometry (ToF-SIMS): Application to Pharmaceutical Materials. American Chemical Society, 2016.

MLA (9th ed.) Citation

Iuras, Andrea, et al. Imaging of Crystalline and Amorphous Surface Regions Using Time-of-flight Secondary-ion Mass Spectrometry (ToF-SIMS): Application to Pharmaceutical Materials. American Chemical Society, 2016.