3D ToF-SIMS imaging of polymer multilayer films using argon cluster sputter depth profiling

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3D ToF-SIMS imaging of polymer multilayer films using argon cluster sputter depth profiling

ToF-SIMS imaging with argon cluster sputter depth profiling has provided detailed insight into the three-dimensional (3D) chemical composition of a series of polymer multilayer structures. Depths of more than 15 μm were profiled in these samples while maintaining uniform sputter rates. The 3D chemic...

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Bibliographic Details
Main Authors:	Bailey, James, Havelund, Rasmus, Shard, Alexander G., Gilmore, Ian S., Alexander, Morgan R., Sharp, James S., Scurr, David J.
Format:	Article
Published:	American Chemical Society 2015
Subjects:	ToF-SIMS; Argon; Depth; Profiling; Polymer; Multilayers
Online Access:	https://eprints.nottingham.ac.uk/31723/

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