3D ToF-SIMS imaging of polymer multilayer films using argon cluster sputter depth profiling
ToF-SIMS imaging with argon cluster sputter depth profiling has provided detailed insight into the three-dimensional (3D) chemical composition of a series of polymer multilayer structures. Depths of more than 15 μm were profiled in these samples while maintaining uniform sputter rates. The 3D chemic...
| Main Authors: | , , , , , , |
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| Format: | Article |
| Published: |
American Chemical Society
2015
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| Subjects: | |
| Online Access: | https://eprints.nottingham.ac.uk/31723/ |