APA (7th ed.) Citation

Bailey, J., Havelund, R., Shard, A. G., Gilmore, I. S., Alexander, M. R., Sharp, J. S., & Scurr, D. J. (2015). 3D ToF-SIMS imaging of polymer multilayer films using argon cluster sputter depth profiling. American Chemical Society.

Chicago Style (17th ed.) Citation

Bailey, James, Rasmus Havelund, Alexander G. Shard, Ian S. Gilmore, Morgan R. Alexander, James S. Sharp, and David J. Scurr. 3D ToF-SIMS Imaging of Polymer Multilayer Films Using Argon Cluster Sputter Depth Profiling. American Chemical Society, 2015.

MLA (9th ed.) Citation

Bailey, James, et al. 3D ToF-SIMS Imaging of Polymer Multilayer Films Using Argon Cluster Sputter Depth Profiling. American Chemical Society, 2015.