Control theory for scanning probe microscopy revisited

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Control theory for scanning probe microscopy revisited

We derive a theoretical model for studying SPM feedback in the context of control theory. Previous models presented in the literature that apply standard models for proportional-integral-derivative controllers predict a highly unstable feedback environment. This model uses features specific to the S...

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Bibliographic Details
Main Author:	Stirling, Julian
Format:	Article
Published:	Beilstein-Institut 2014
Subjects:	AFM; control theory; feedback; scanning probe microscopy
Online Access:	https://eprints.nottingham.ac.uk/31694/

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