Control theory for scanning probe microscopy revisited
We derive a theoretical model for studying SPM feedback in the context of control theory. Previous models presented in the literature that apply standard models for proportional-integral-derivative controllers predict a highly unstable feedback environment. This model uses features specific to the S...
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| Format: | Article |
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Beilstein-Institut
2014
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| Online Access: | https://eprints.nottingham.ac.uk/31694/ |
| _version_ | 1848794254958133248 |
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| author | Stirling, Julian |
| author_facet | Stirling, Julian |
| author_sort | Stirling, Julian |
| building | Nottingham Research Data Repository |
| collection | Online Access |
| description | We derive a theoretical model for studying SPM feedback in the context of control theory. Previous models presented in the literature that apply standard models for proportional-integral-derivative controllers predict a highly unstable feedback environment. This model uses features specific to the SPM implementation of the proportional-integral controller to give realistic feedback behaviour. As such the stability of SPM feedback for a wide range of feedback gains can be understood. Further consideration of mechanical responses of the SPM system gives insight into the causes of exciting mechanical resonances of the scanner during feedback operation. |
| first_indexed | 2025-11-14T19:13:17Z |
| format | Article |
| id | nottingham-31694 |
| institution | University of Nottingham Malaysia Campus |
| institution_category | Local University |
| last_indexed | 2025-11-14T19:13:17Z |
| publishDate | 2014 |
| publisher | Beilstein-Institut |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | nottingham-316942020-05-04T20:17:49Z https://eprints.nottingham.ac.uk/31694/ Control theory for scanning probe microscopy revisited Stirling, Julian We derive a theoretical model for studying SPM feedback in the context of control theory. Previous models presented in the literature that apply standard models for proportional-integral-derivative controllers predict a highly unstable feedback environment. This model uses features specific to the SPM implementation of the proportional-integral controller to give realistic feedback behaviour. As such the stability of SPM feedback for a wide range of feedback gains can be understood. Further consideration of mechanical responses of the SPM system gives insight into the causes of exciting mechanical resonances of the scanner during feedback operation. Beilstein-Institut 2014 Article PeerReviewed Stirling, Julian (2014) Control theory for scanning probe microscopy revisited. Beilstein Journal of Nanotechnology, 5 . pp. 337-345. ISSN 2190-4286 AFM; control theory; feedback; scanning probe microscopy http://www.beilstein-journals.org/bjnano/single/articleFullText.htm?publicId=2190-4286-5-38 doi:10.3762/bjnano.5.38 doi:10.3762/bjnano.5.38 |
| spellingShingle | AFM; control theory; feedback; scanning probe microscopy Stirling, Julian Control theory for scanning probe microscopy revisited |
| title | Control theory for scanning probe microscopy revisited |
| title_full | Control theory for scanning probe microscopy revisited |
| title_fullStr | Control theory for scanning probe microscopy revisited |
| title_full_unstemmed | Control theory for scanning probe microscopy revisited |
| title_short | Control theory for scanning probe microscopy revisited |
| title_sort | control theory for scanning probe microscopy revisited |
| topic | AFM; control theory; feedback; scanning probe microscopy |
| url | https://eprints.nottingham.ac.uk/31694/ https://eprints.nottingham.ac.uk/31694/ https://eprints.nottingham.ac.uk/31694/ |