APA (7th ed.) Citation

Taylor, M., Scurr, D., Lutolf, M., Buttery, L. D., Zelzer, M., & Alexander, M. R. (2015). 3D chemical characterization of frozen hydrated hydrogels using ToF-SIMS with argon cluster sputter depth profiling. American Vacuum Society.

Chicago Style (17th ed.) Citation

Taylor, Michael, David Scurr, Matthias Lutolf, Lee D.K Buttery, Mischa Zelzer, and Morgan R. Alexander. 3D Chemical Characterization of Frozen Hydrated Hydrogels Using ToF-SIMS with Argon Cluster Sputter Depth Profiling. American Vacuum Society, 2015.

MLA (9th ed.) Citation

Taylor, Michael, et al. 3D Chemical Characterization of Frozen Hydrated Hydrogels Using ToF-SIMS with Argon Cluster Sputter Depth Profiling. American Vacuum Society, 2015.