APA (7th ed.) Citation

Li, J., Castellazzi, A., Dai, T., Corfield, M., Solomon, A. K., & Johnson, C. M. (2015). Built-in reliability design of highly integrated solid-state power switches with metal bump interconnects. Institute of Electrical and Electronics Engineers.

Chicago Style (17th ed.) Citation

Li, Jianfeng, Alberto Castellazzi, Tianxiang Dai, Martin Corfield, Adane Kassa Solomon, and Christopher Mark Johnson. Built-in Reliability Design of Highly Integrated Solid-state Power Switches with Metal Bump Interconnects. Institute of Electrical and Electronics Engineers, 2015.

MLA (9th ed.) Citation

Li, Jianfeng, et al. Built-in Reliability Design of Highly Integrated Solid-state Power Switches with Metal Bump Interconnects. Institute of Electrical and Electronics Engineers, 2015.