Phonon scattering by impurities in semiconductors

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Phonon scattering by impurities in semiconductors

Thermal conductivity measurements have been used to study the low lying energy levels of Cr ions in GaAs. Strong resonant phonon scattering was observed in semi-insulating (SI) and p-type samples, which is attributed to Cr 2+ or Cr 3+ ions, while the scattering in the n-type samples additional to th...

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Bibliographic Details
Main Author:	Ramdane, Abderrahim
Format:	Thesis (University of Nottingham only)
Language:	English
Published:	1980
Online Access:	https://eprints.nottingham.ac.uk/28992/

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