Confocal surface plasmon microscopy with pupil function engineering

Surface Plasmon microscopy can measure local changes of refractive index on the micron scale. Interferometric plasmon imaging delivers quantitative high spatial resolution sensitive to refractive index. In addition the so called V(z) method allows image contrast to be controlled by varying the sampl...

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Main Authors: Zhang, Bei, Pechprasarn, Suejit, Zhang, Jing, Somekh, Michael G.
Format: Article
Published: Optical Society of America 2012
Online Access:https://eprints.nottingham.ac.uk/2868/
_version_ 1848790896028418048
author Zhang, Bei
Pechprasarn, Suejit
Zhang, Jing
Somekh, Michael G.
author_facet Zhang, Bei
Pechprasarn, Suejit
Zhang, Jing
Somekh, Michael G.
author_sort Zhang, Bei
building Nottingham Research Data Repository
collection Online Access
description Surface Plasmon microscopy can measure local changes of refractive index on the micron scale. Interferometric plasmon imaging delivers quantitative high spatial resolution sensitive to refractive index. In addition the so called V(z) method allows image contrast to be controlled by varying the sample defocus without substantially degrading spatial resolution. Here, we show how a confocal system provides a simpler and more stable alternative. This system, however, places greater demands on the dynamic range of the system. We therefore use a spatial light modulator to engineer the microscope pupil function to suppress light that does not contribute to the signal.
first_indexed 2025-11-14T18:19:53Z
format Article
id nottingham-2868
institution University of Nottingham Malaysia Campus
institution_category Local University
last_indexed 2025-11-14T18:19:53Z
publishDate 2012
publisher Optical Society of America
recordtype eprints
repository_type Digital Repository
spelling nottingham-28682020-05-04T16:32:48Z https://eprints.nottingham.ac.uk/2868/ Confocal surface plasmon microscopy with pupil function engineering Zhang, Bei Pechprasarn, Suejit Zhang, Jing Somekh, Michael G. Surface Plasmon microscopy can measure local changes of refractive index on the micron scale. Interferometric plasmon imaging delivers quantitative high spatial resolution sensitive to refractive index. In addition the so called V(z) method allows image contrast to be controlled by varying the sample defocus without substantially degrading spatial resolution. Here, we show how a confocal system provides a simpler and more stable alternative. This system, however, places greater demands on the dynamic range of the system. We therefore use a spatial light modulator to engineer the microscope pupil function to suppress light that does not contribute to the signal. Optical Society of America 2012-03-15 Article PeerReviewed Zhang, Bei, Pechprasarn, Suejit, Zhang, Jing and Somekh, Michael G. (2012) Confocal surface plasmon microscopy with pupil function engineering. Optics Express, 20 (7). pp. 7388-7397. ISSN 1094-4087 http://www.opticsinfobase.org/oe/abstract.cfm?uri=oe-20-7-7388 doi:10.1364/OE.20.007388 doi:10.1364/OE.20.007388
spellingShingle Zhang, Bei
Pechprasarn, Suejit
Zhang, Jing
Somekh, Michael G.
Confocal surface plasmon microscopy with pupil function engineering
title Confocal surface plasmon microscopy with pupil function engineering
title_full Confocal surface plasmon microscopy with pupil function engineering
title_fullStr Confocal surface plasmon microscopy with pupil function engineering
title_full_unstemmed Confocal surface plasmon microscopy with pupil function engineering
title_short Confocal surface plasmon microscopy with pupil function engineering
title_sort confocal surface plasmon microscopy with pupil function engineering
url https://eprints.nottingham.ac.uk/2868/
https://eprints.nottingham.ac.uk/2868/
https://eprints.nottingham.ac.uk/2868/