Scanning probe image wizard: a toolbox for automated scanning probe microscopy data analysis

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Scanning probe image wizard: a toolbox for automated scanning probe microscopy data analysis

We describe SPIW (scanning probe image wizard), a new image processing toolbox for SPM (scanning probe microscope) images. SPIW can be used to automate many aspects of SPM data analysis, even for images with surface contamination and step edges present. Specialised routines are available for images...

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Bibliographic Details
Main Authors:	Stirling, Julian, Woolley, Richard, Moriarty, Philip
Format:	Article
Published:	American Institute of Physics 2013
Online Access:	https://eprints.nottingham.ac.uk/2467/

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