Novel scanning probe microscope instrumentation with applications in nanotechnology

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Novel scanning probe microscope instrumentation with applications in nanotechnology

A versatile scanning probe microscope controller has been constructed. Its suitability for the control of a range of different scanning probe microscope heads has been demonstrated. These include an ultra high vacuum scanning tunnelling microscope, with which atomic resolution images of Si surfaces...

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Bibliographic Details
Main Author:	Humphry, Martin James
Format:	Thesis (University of Nottingham only)
Language:	English
Published:	2000
Subjects:	Control equipment Scanning tunneling microscopy Manipulators Atomic force microscopy Scanning light microscopy Solid state physics
Online Access:	https://eprints.nottingham.ac.uk/13743/

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