Time of flight mass spectrometry of pharmaceutical systems

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Time of flight mass spectrometry of pharmaceutical systems

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a widely used surface chemical analysis technique that is traditionally employed to characterise the first few molecular layers of a material interface. The ability of this technique to accurately reflect the surface chemistry of polymers,...

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Bibliographic Details
Main Author:	Armitage Nolan, Jennifer Claire
Format:	Thesis (University of Nottingham only)
Language:	English
Published:	2013
Online Access:	https://eprints.nottingham.ac.uk/13701/

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