Forces at the nanoscale : interactions in atomic force microscopy and dielectrophoresis

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Forces at the nanoscale : interactions in atomic force microscopy and dielectrophoresis

Interactions at the nanoscale are governed almost exclusively by electromagnetic forces, but the interplay between different scaling laws produces a vast array of behaviours. We investigate radically different systems spanning almost three orders of magnitude of length scales, and use a variety of e...

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Bibliographic Details
Main Author:	Sweetman, Adam
Format:	Thesis (University of Nottingham only)
Language:	English
Published:	2010
Subjects:	NC-AFM STM Si(100) c60 Fullerene AFM Nanoparticle Dielectrophoresis DEP qPlus Kelvin Probe
Online Access:	https://eprints.nottingham.ac.uk/11213/

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