DIELECTRIC CONSTANT MEASUREMENT FOR THIN MATERIAL AT MICROWAVE FREQUENCIES

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DIELECTRIC CONSTANT MEASUREMENT FOR THIN MATERIAL AT MICROWAVE FREQUENCIES

A practical problem in the reflection method for dielectric constant measurement is the difficulty to ensure the sample is placed exactly at the waveguide flange. A small position offset of the dielectric sample will give rise to some errors in calculating the dielectric constant, especially when a...

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Bibliographic Details
Main Author:	Chung, Boon-Kuan
Format:	Article
Published:	E M W PUBLISHING 2007
Subjects:	T Technology (General) QC Physics
Online Access:	http://shdl.mmu.edu.my/3120/

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