DIELECTRIC CONSTANT MEASUREMENT FOR THIN MATERIAL AT MICROWAVE FREQUENCIES
A practical problem in the reflection method for dielectric constant measurement is the difficulty to ensure the sample is placed exactly at the waveguide flange. A small position offset of the dielectric sample will give rise to some errors in calculating the dielectric constant, especially when a...
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| Format: | Article |
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E M W PUBLISHING
2007
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| Online Access: | http://shdl.mmu.edu.my/3120/ |