Negative differential mobility in GaAs at ultrahigh fields: Comparison between an experiment and simulations

Direct measurement of the electron velocity v(n) at an extreme electric field E is problematic due to impact ionization. The dependence v(n)(E) obtained by a Monte Carlo method can be verified, however, by comparing simulated and experimental data on superfast switching in a GaAs bipolar transistor...

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Main Authors: Vainshtein, Sergey, Yuferev, Valentin, Palankovski, Vassil, Ong, Duu-Sheng, Kostamovaara, Juha
Format: Article
Published: AMER INST PHYSICS 2008
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Online Access:http://shdl.mmu.edu.my/2766/
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author Vainshtein, Sergey
Yuferev, Valentin
Palankovski, Vassil
Ong, Duu-Sheng
Kostamovaara, Juha
author_facet Vainshtein, Sergey
Yuferev, Valentin
Palankovski, Vassil
Ong, Duu-Sheng
Kostamovaara, Juha
author_sort Vainshtein, Sergey
building MMU Institutional Repository
collection Online Access
description Direct measurement of the electron velocity v(n) at an extreme electric field E is problematic due to impact ionization. The dependence v(n)(E) obtained by a Monte Carlo method can be verified, however, by comparing simulated and experimental data on superfast switching in a GaAs bipolar transistor structure, in which the switching transient is very sensitive to this dependence at high electric fields (up to 0.6 MV/cm). Such a comparison allows the conclusion to be made that the change from negative to positive differential mobility predicted earlier at E similar to 0.3 MV/cm should not happen until the electric field exceeds 0.6 MV/cm. (c) 2008 American Institute of Physics.
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spelling mmu-27662011-09-13T07:03:29Z http://shdl.mmu.edu.my/2766/ Negative differential mobility in GaAs at ultrahigh fields: Comparison between an experiment and simulations Vainshtein, Sergey Yuferev, Valentin Palankovski, Vassil Ong, Duu-Sheng Kostamovaara, Juha T Technology (General) QC Physics Direct measurement of the electron velocity v(n) at an extreme electric field E is problematic due to impact ionization. The dependence v(n)(E) obtained by a Monte Carlo method can be verified, however, by comparing simulated and experimental data on superfast switching in a GaAs bipolar transistor structure, in which the switching transient is very sensitive to this dependence at high electric fields (up to 0.6 MV/cm). Such a comparison allows the conclusion to be made that the change from negative to positive differential mobility predicted earlier at E similar to 0.3 MV/cm should not happen until the electric field exceeds 0.6 MV/cm. (c) 2008 American Institute of Physics. AMER INST PHYSICS 2008-02 Article NonPeerReviewed Vainshtein, Sergey and Yuferev, Valentin and Palankovski, Vassil and Ong, Duu-Sheng and Kostamovaara, Juha (2008) Negative differential mobility in GaAs at ultrahigh fields: Comparison between an experiment and simulations. Applied Physics Letters, 92 (6). 062114. ISSN 00036951 http://dx.doi.org/10.1063/1.2870096 doi:10.1063/1.2870096 doi:10.1063/1.2870096
spellingShingle T Technology (General)
QC Physics
Vainshtein, Sergey
Yuferev, Valentin
Palankovski, Vassil
Ong, Duu-Sheng
Kostamovaara, Juha
Negative differential mobility in GaAs at ultrahigh fields: Comparison between an experiment and simulations
title Negative differential mobility in GaAs at ultrahigh fields: Comparison between an experiment and simulations
title_full Negative differential mobility in GaAs at ultrahigh fields: Comparison between an experiment and simulations
title_fullStr Negative differential mobility in GaAs at ultrahigh fields: Comparison between an experiment and simulations
title_full_unstemmed Negative differential mobility in GaAs at ultrahigh fields: Comparison between an experiment and simulations
title_short Negative differential mobility in GaAs at ultrahigh fields: Comparison between an experiment and simulations
title_sort negative differential mobility in gaas at ultrahigh fields: comparison between an experiment and simulations
topic T Technology (General)
QC Physics
url http://shdl.mmu.edu.my/2766/
http://shdl.mmu.edu.my/2766/
http://shdl.mmu.edu.my/2766/