Ong, D. S., Li, K. F., Plimmer, S. A., Rees, G. J., David, J. P. R., & Robson, P. N. (2000). Full band Monte Carlo modeling of impact ionization, avalanche multiplication, and noise in submicron GaAs p[sup +]-i-n[sup +] diodes.
Chicago Style (17th ed.) CitationOng, D. S., K. F. Li, S. A. Plimmer, G. J. Rees, J. P. R. David, and P. N. Robson. Full Band Monte Carlo Modeling of Impact Ionization, Avalanche Multiplication, and Noise in Submicron GaAs P[sup +]-i-n[sup +] Diodes. 2000.
MLA (9th ed.) CitationOng, D. S., et al. Full Band Monte Carlo Modeling of Impact Ionization, Avalanche Multiplication, and Noise in Submicron GaAs P[sup +]-i-n[sup +] Diodes. 2000.
Warning: These citations may not always be 100% accurate.