Sim,, K., Chuah,, H., & Kamel,, N. (2005). The Scanning Electron Microscope (SEM) assessment system using the autoregressive (AR) technique.
Chicago Style (17th ed.) CitationSim,, KS, HT Chuah,, and NS Kamel. The Scanning Electron Microscope (SEM) Assessment System Using the Autoregressive (AR) Technique. 2005.
MLA (9th ed.) CitationSim,, KS, et al. The Scanning Electron Microscope (SEM) Assessment System Using the Autoregressive (AR) Technique. 2005.
Warning: These citations may not always be 100% accurate.