Autoregressive Wiener filtering in a scanning electron microscopy imaging system

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Autoregressive Wiener filtering in a scanning electron microscopy imaging system

In this paper, we propose to use the autoregressive (AR)-based interpolator with Wiener filter and apply the idea to scanning electron microscope (SEM) images. The concept for combining the AR-based interpolator with Wiener filtering comes from the essential requirement of Wiener filtering for accur...

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Bibliographic Details
Main Authors:	Sim, , KS, Kamel,, NS, Chuah, , HT
Format:	Article
Published:	2005
Subjects:	TA Engineering (General). Civil engineering (General)
Online Access:	http://shdl.mmu.edu.my/2237/

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