Autoregressive Wiener filtering in a scanning electron microscopy imaging system

In this paper, we propose to use the autoregressive (AR)-based interpolator with Wiener filter and apply the idea to scanning electron microscope (SEM) images. The concept for combining the AR-based interpolator with Wiener filtering comes from the essential requirement of Wiener filtering for accur...

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Main Authors: Sim, , KS, Kamel,, NS, Chuah, , HT
Format: Article
Published: 2005
Subjects:
Online Access:http://shdl.mmu.edu.my/2237/
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author Sim, , KS
Kamel,, NS
Chuah, , HT
author_facet Sim, , KS
Kamel,, NS
Chuah, , HT
author_sort Sim, , KS
building MMU Institutional Repository
collection Online Access
description In this paper, we propose to use the autoregressive (AR)-based interpolator with Wiener filter and apply the idea to scanning electron microscope (SEM) images. The concept for combining the AR-based interpolator with Wiener filtering comes from the essential requirement of Wiener filtering for accurate and consistent estimation of the power of the noise in images prior to filter implementation. The resultant filter is called AR-Wiener filter. The proposed filter is embedded onto the frame grabber card of the scanning electron microscope (SEM) for real-time image processing. Different images are captured using SEM and used to compare the performances of the conventional Wiener and the proposed AR-Wiener technique.
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spelling mmu-22372011-08-12T06:25:42Z http://shdl.mmu.edu.my/2237/ Autoregressive Wiener filtering in a scanning electron microscopy imaging system Sim, , KS Kamel,, NS Chuah, , HT TA Engineering (General). Civil engineering (General) In this paper, we propose to use the autoregressive (AR)-based interpolator with Wiener filter and apply the idea to scanning electron microscope (SEM) images. The concept for combining the AR-based interpolator with Wiener filtering comes from the essential requirement of Wiener filtering for accurate and consistent estimation of the power of the noise in images prior to filter implementation. The resultant filter is called AR-Wiener filter. The proposed filter is embedded onto the frame grabber card of the scanning electron microscope (SEM) for real-time image processing. Different images are captured using SEM and used to compare the performances of the conventional Wiener and the proposed AR-Wiener technique. 2005-05 Article NonPeerReviewed Sim, , KS and Kamel,, NS and Chuah, , HT (2005) Autoregressive Wiener filtering in a scanning electron microscopy imaging system. SCANNING, 27 (3). pp. 147-153. ISSN 0161-0457
spellingShingle TA Engineering (General). Civil engineering (General)
Sim, , KS
Kamel,, NS
Chuah, , HT
Autoregressive Wiener filtering in a scanning electron microscopy imaging system
title Autoregressive Wiener filtering in a scanning electron microscopy imaging system
title_full Autoregressive Wiener filtering in a scanning electron microscopy imaging system
title_fullStr Autoregressive Wiener filtering in a scanning electron microscopy imaging system
title_full_unstemmed Autoregressive Wiener filtering in a scanning electron microscopy imaging system
title_short Autoregressive Wiener filtering in a scanning electron microscopy imaging system
title_sort autoregressive wiener filtering in a scanning electron microscopy imaging system
topic TA Engineering (General). Civil engineering (General)
url http://shdl.mmu.edu.my/2237/