Avalanche Multiplication and Excess Noise Factor of Heterojunction Avalanche Photodiodes

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Avalanche Multiplication and Excess Noise Factor of Heterojunction Avalanche Photodiodes

A Monte Carlo (MC) model to compute the statistics of avalanche multiplication and excess noise factor in heterojunction avalanche photodiode (HAPD) is presented. The proposed model is able to simulate the multiplication gain and excess noise factor incorporating the dead-space effect, band-edge dis...

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Bibliographic Details
Main Authors:	You, A. H., Low, L. C., Cheang, P. L.
Format:	Conference or Workshop Item
Published:	2006
Subjects:	QC Physics
Online Access:	http://shdl.mmu.edu.my/2132/

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