Avalanche Multiplication and Excess Noise Factor of Heterojunction Avalanche Photodiodes

A Monte Carlo (MC) model to compute the statistics of avalanche multiplication and excess noise factor in heterojunction avalanche photodiode (HAPD) is presented. The proposed model is able to simulate the multiplication gain and excess noise factor incorporating the dead-space effect, band-edge dis...

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Main Authors: You, A. H., Low, L. C., Cheang, P. L.
Format: Conference or Workshop Item
Published: 2006
Subjects:
Online Access:http://shdl.mmu.edu.my/2132/
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author You, A. H.
Low, L. C.
Cheang, P. L.
author_facet You, A. H.
Low, L. C.
Cheang, P. L.
author_sort You, A. H.
building MMU Institutional Repository
collection Online Access
description A Monte Carlo (MC) model to compute the statistics of avalanche multiplication and excess noise factor in heterojunction avalanche photodiode (HAPD) is presented. The proposed model is able to simulate the multiplication gain and excess noise factor incorporating the dead-space effect, band-edge discontinuity and hole to electron ionization ratio in HAPDs. The deadspace effect is included in our model, which has been shown to play an important role in reducing noise in homojunction APDs. It is shown that the dead-space effect also reduces the avalanche noise in heterojunction devices. We demonstrate that the dead-space effect and feedback impact ionization are the dominant effects to improve the excess noise factor in HAPDs.
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publishDate 2006
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spelling mmu-21322011-09-21T08:15:35Z http://shdl.mmu.edu.my/2132/ Avalanche Multiplication and Excess Noise Factor of Heterojunction Avalanche Photodiodes You, A. H. Low, L. C. Cheang, P. L. QC Physics A Monte Carlo (MC) model to compute the statistics of avalanche multiplication and excess noise factor in heterojunction avalanche photodiode (HAPD) is presented. The proposed model is able to simulate the multiplication gain and excess noise factor incorporating the dead-space effect, band-edge discontinuity and hole to electron ionization ratio in HAPDs. The deadspace effect is included in our model, which has been shown to play an important role in reducing noise in homojunction APDs. It is shown that the dead-space effect also reduces the avalanche noise in heterojunction devices. We demonstrate that the dead-space effect and feedback impact ionization are the dominant effects to improve the excess noise factor in HAPDs. 2006 Conference or Workshop Item NonPeerReviewed You, A. H. and Low, L. C. and Cheang, P. L. (2006) Avalanche Multiplication and Excess Noise Factor of Heterojunction Avalanche Photodiodes. In: IEEE International Conference on Semiconductor Electronics. http://dx.doi.org/10.1109/SMELEC.2006.381074 doi:10.1109/SMELEC.2006.381074 doi:10.1109/SMELEC.2006.381074
spellingShingle QC Physics
You, A. H.
Low, L. C.
Cheang, P. L.
Avalanche Multiplication and Excess Noise Factor of Heterojunction Avalanche Photodiodes
title Avalanche Multiplication and Excess Noise Factor of Heterojunction Avalanche Photodiodes
title_full Avalanche Multiplication and Excess Noise Factor of Heterojunction Avalanche Photodiodes
title_fullStr Avalanche Multiplication and Excess Noise Factor of Heterojunction Avalanche Photodiodes
title_full_unstemmed Avalanche Multiplication and Excess Noise Factor of Heterojunction Avalanche Photodiodes
title_short Avalanche Multiplication and Excess Noise Factor of Heterojunction Avalanche Photodiodes
title_sort avalanche multiplication and excess noise factor of heterojunction avalanche photodiodes
topic QC Physics
url http://shdl.mmu.edu.my/2132/
http://shdl.mmu.edu.my/2132/
http://shdl.mmu.edu.my/2132/