Artificial Neural Network Based Prediction Of Electrical Test Parameters In Wafer Fabrication Technology
In semiconductor industry, cycle time of the wafer fabrication is very crucial and one of the contributing factors comes from wafer testing. This thesis presents the application of back propagation Artificial Neural Network (ANN) model designed to infer electrical test parameters from the given list...
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| Format: | Thesis |
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2005
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| Online Access: | http://shdl.mmu.edu.my/1214/ |
| _version_ | 1848789725079404544 |
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| author | Ke, Joseph Kian Seng |
| author_facet | Ke, Joseph Kian Seng |
| author_sort | Ke, Joseph Kian Seng |
| building | MMU Institutional Repository |
| collection | Online Access |
| description | In semiconductor industry, cycle time of the wafer fabrication is very crucial and one of the contributing factors comes from wafer testing. This thesis presents the application of back propagation Artificial Neural Network (ANN) model designed to infer electrical test parameters from the given list of parameters with the intention of reducing test time, to enhance throughput, and to improve cycle time. |
| first_indexed | 2025-11-14T18:01:17Z |
| format | Thesis |
| id | mmu-1214 |
| institution | Multimedia University |
| institution_category | Local University |
| last_indexed | 2025-11-14T18:01:17Z |
| publishDate | 2005 |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | mmu-12142010-08-19T08:19:21Z http://shdl.mmu.edu.my/1214/ Artificial Neural Network Based Prediction Of Electrical Test Parameters In Wafer Fabrication Technology Ke, Joseph Kian Seng QA76.75-76.765 Computer software In semiconductor industry, cycle time of the wafer fabrication is very crucial and one of the contributing factors comes from wafer testing. This thesis presents the application of back propagation Artificial Neural Network (ANN) model designed to infer electrical test parameters from the given list of parameters with the intention of reducing test time, to enhance throughput, and to improve cycle time. 2005-03 Thesis NonPeerReviewed Ke, Joseph Kian Seng (2005) Artificial Neural Network Based Prediction Of Electrical Test Parameters In Wafer Fabrication Technology. Masters thesis, Multimedia University. http://myto.perpun.net.my/metoalogin/logina.php |
| spellingShingle | QA76.75-76.765 Computer software Ke, Joseph Kian Seng Artificial Neural Network Based Prediction Of Electrical Test Parameters In Wafer Fabrication Technology |
| title | Artificial Neural Network Based Prediction Of Electrical Test Parameters In Wafer Fabrication Technology |
| title_full | Artificial Neural Network Based Prediction Of Electrical Test Parameters In Wafer Fabrication Technology |
| title_fullStr | Artificial Neural Network Based Prediction Of Electrical Test Parameters In Wafer Fabrication Technology |
| title_full_unstemmed | Artificial Neural Network Based Prediction Of Electrical Test Parameters In Wafer Fabrication Technology |
| title_short | Artificial Neural Network Based Prediction Of Electrical Test Parameters In Wafer Fabrication Technology |
| title_sort | artificial neural network based prediction of electrical test parameters in wafer fabrication technology |
| topic | QA76.75-76.765 Computer software |
| url | http://shdl.mmu.edu.my/1214/ http://shdl.mmu.edu.my/1214/ |