Signal -To-Noise Ratio Estimation In Scanning Electron Microscope Imaging System

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Signal -To-Noise Ratio Estimation In Scanning Electron Microscope Imaging System

Two new methods, the Autoregressive(AR) model and the Mixed Lagrange Time Delay Estimation Autoregressive (MLTDEAR) model, are developed to estimate the Signal-to-Noise Ratio (SNR) from a single image for the Scanning Electron Microscope (SEM) Imaging System application.

Bibliographic Details
Main Author:	Sim, Kok Swee
Format:	Thesis
Published:	2006
Subjects:	TK Electrical engineering. Electronics Nuclear engineering
Online Access:	http://shdl.mmu.edu.my/1174/

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