Signal -To-Noise Ratio Estimation In Scanning Electron Microscope Imaging System
Two new methods, the Autoregressive(AR) model and the Mixed Lagrange Time Delay Estimation Autoregressive (MLTDEAR) model, are developed to estimate the Signal-to-Noise Ratio (SNR) from a single image for the Scanning Electron Microscope (SEM) Imaging System application.
| Main Author: | |
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| Format: | Thesis |
| Published: |
2006
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| Subjects: | |
| Online Access: | http://shdl.mmu.edu.my/1174/ |
| _version_ | 1848789714038947840 |
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| author | Sim, Kok Swee |
| author_facet | Sim, Kok Swee |
| author_sort | Sim, Kok Swee |
| building | MMU Institutional Repository |
| collection | Online Access |
| description | Two new methods, the Autoregressive(AR) model and the Mixed Lagrange Time Delay Estimation Autoregressive (MLTDEAR) model, are developed to estimate the Signal-to-Noise Ratio (SNR) from a single image for the Scanning Electron Microscope (SEM) Imaging System application. |
| first_indexed | 2025-11-14T18:01:06Z |
| format | Thesis |
| id | mmu-1174 |
| institution | Multimedia University |
| institution_category | Local University |
| last_indexed | 2025-11-14T18:01:06Z |
| publishDate | 2006 |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | mmu-11742010-08-23T00:59:49Z http://shdl.mmu.edu.my/1174/ Signal -To-Noise Ratio Estimation In Scanning Electron Microscope Imaging System Sim, Kok Swee TK Electrical engineering. Electronics Nuclear engineering Two new methods, the Autoregressive(AR) model and the Mixed Lagrange Time Delay Estimation Autoregressive (MLTDEAR) model, are developed to estimate the Signal-to-Noise Ratio (SNR) from a single image for the Scanning Electron Microscope (SEM) Imaging System application. 2006-04 Thesis NonPeerReviewed Sim, Kok Swee (2006) Signal -To-Noise Ratio Estimation In Scanning Electron Microscope Imaging System. PhD thesis, Multimedia University. http://myto.perpun.net.my/metoalogin/logina.php |
| spellingShingle | TK Electrical engineering. Electronics Nuclear engineering Sim, Kok Swee Signal -To-Noise Ratio Estimation In Scanning Electron Microscope Imaging System |
| title | Signal -To-Noise Ratio Estimation In Scanning Electron Microscope Imaging System |
| title_full | Signal -To-Noise Ratio Estimation In Scanning Electron Microscope Imaging System |
| title_fullStr | Signal -To-Noise Ratio Estimation In Scanning Electron Microscope Imaging System |
| title_full_unstemmed | Signal -To-Noise Ratio Estimation In Scanning Electron Microscope Imaging System |
| title_short | Signal -To-Noise Ratio Estimation In Scanning Electron Microscope Imaging System |
| title_sort | signal -to-noise ratio estimation in scanning electron microscope imaging system |
| topic | TK Electrical engineering. Electronics Nuclear engineering |
| url | http://shdl.mmu.edu.my/1174/ http://shdl.mmu.edu.my/1174/ |