Kang, B. H. (2006). Surface Photo Voltage Measurement Of Ultra-Violet Irradiation Effects In Oxidized Silicon Wafers.
Chicago Style (17th ed.) CitationKang, Ban Hong. Surface Photo Voltage Measurement Of Ultra-Violet Irradiation Effects In Oxidized Silicon Wafers. 2006.
MLA (9th ed.) CitationKang, Ban Hong. Surface Photo Voltage Measurement Of Ultra-Violet Irradiation Effects In Oxidized Silicon Wafers. 2006.
Warning: These citations may not always be 100% accurate.