Characterization of nickel lead sulphide thin films: X-Ray diffraction studies

Characterization of nickel lead sulphide thin films: X-Ray diffraction studies

In this work, nickel lead sulphide thin films were grown by inexpensive and simple method, namely chemical bath deposition technique. Nickel sulphate, sodium thiosulfate and lead nitrate as the sources of Ni2+, S2- and Pb2+ ions, respectively. The effect of deposition period will be studied from 8...

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Bibliographic Details
Main Author: Ho, Soon Min
Format: Article
Language:English
Published: Asian Research Publishing Network 2017
Subjects:
TA Engineering (General). Civil engineering (General)
Online Access:http://eprints.intimal.edu.my/958/
http://eprints.intimal.edu.my/958/1/Characterization%20of%20nickel%20lead%20sulphide%20thin%20films%20X-Ray%20diffraction%20studies.pdf

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