Deposition and Characterization of Tin Sulphide Thin Films by Chemical Bath Deposition Technique

Tin sulphide thin films were deposited onto microscope glass slides by chemical bath deposition method using Na2EDTA as a complexing agent. The main advantages of this method were low cost, low temperature and simple set-up equipments. The structural, morphological and optical properties of SnS film...

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Main Author: Ho, Soon Min
Format: Article
Published: Research India Publications 2011
Subjects:
Online Access:http://eprints.intimal.edu.my/900/
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author Ho, Soon Min
author_facet Ho, Soon Min
author_sort Ho, Soon Min
building INTI Institutional Repository
collection Online Access
description Tin sulphide thin films were deposited onto microscope glass slides by chemical bath deposition method using Na2EDTA as a complexing agent. The main advantages of this method were low cost, low temperature and simple set-up equipments. The structural, morphological and optical properties of SnS films were studied by X-ray diffraction, atomic force microscopy, scanning electron microscopy and UV-Visible spectrophotometer, respectively. X-ray diffraction studies indicated the presence of polycrystalline nature with cubic structure. Atomic force microscopy image and scanning electron microscopy micrograph revealed that grains were uniformly distributed over the surface of substrate. Optical band gap values of direct and indirect transitions were observed to be 1.5 eV and 1.0 eV, respectively.
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spelling intimal-9002017-08-25T06:35:31Z http://eprints.intimal.edu.my/900/ Deposition and Characterization of Tin Sulphide Thin Films by Chemical Bath Deposition Technique Ho, Soon Min TK Electrical engineering. Electronics Nuclear engineering Tin sulphide thin films were deposited onto microscope glass slides by chemical bath deposition method using Na2EDTA as a complexing agent. The main advantages of this method were low cost, low temperature and simple set-up equipments. The structural, morphological and optical properties of SnS films were studied by X-ray diffraction, atomic force microscopy, scanning electron microscopy and UV-Visible spectrophotometer, respectively. X-ray diffraction studies indicated the presence of polycrystalline nature with cubic structure. Atomic force microscopy image and scanning electron microscopy micrograph revealed that grains were uniformly distributed over the surface of substrate. Optical band gap values of direct and indirect transitions were observed to be 1.5 eV and 1.0 eV, respectively. Research India Publications 2011 Article PeerReviewed Ho, Soon Min (2011) Deposition and Characterization of Tin Sulphide Thin Films by Chemical Bath Deposition Technique. International Journal of Applied Chemistry, 7 (2). ISSN 0973-9734 https://www.ripublication.com/ijac.htm
spellingShingle TK Electrical engineering. Electronics Nuclear engineering
Ho, Soon Min
Deposition and Characterization of Tin Sulphide Thin Films by Chemical Bath Deposition Technique
title Deposition and Characterization of Tin Sulphide Thin Films by Chemical Bath Deposition Technique
title_full Deposition and Characterization of Tin Sulphide Thin Films by Chemical Bath Deposition Technique
title_fullStr Deposition and Characterization of Tin Sulphide Thin Films by Chemical Bath Deposition Technique
title_full_unstemmed Deposition and Characterization of Tin Sulphide Thin Films by Chemical Bath Deposition Technique
title_short Deposition and Characterization of Tin Sulphide Thin Films by Chemical Bath Deposition Technique
title_sort deposition and characterization of tin sulphide thin films by chemical bath deposition technique
topic TK Electrical engineering. Electronics Nuclear engineering
url http://eprints.intimal.edu.my/900/
http://eprints.intimal.edu.my/900/