Investigation of the electrical properties of metal chalcogenide thin films: A review
In the present study, thin films have been successfully prepared by using various deposition methods. The electrical behaviors of obtained thin films were investigated by using Hall Effect measurement and Van Der Pauw technique as reported by many researchers. The experiment results show that the...
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| Format: | Article |
| Language: | English |
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Scholars Research Library
2016
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| Online Access: | http://eprints.intimal.edu.my/489/ http://eprints.intimal.edu.my/489/1/Investigation%20of%20the%20electrical%20properties%20of%20metal%20chalcogenide%20thin%20films_a%20review.pdf |
| _version_ | 1848766488745345024 |
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| author | Ho, Soon Min |
| author_facet | Ho, Soon Min |
| author_sort | Ho, Soon Min |
| building | INTI Institutional Repository |
| collection | Online Access |
| description | In the present study, thin films have been successfully prepared by using various deposition methods. The electrical
behaviors of obtained thin films were investigated by using Hall Effect measurement and Van Der Pauw technique
as reported by many researchers. The experiment results show that the electrical resistivity reduces with increase in
temperature and film thickness as well. |
| first_indexed | 2025-11-14T11:51:57Z |
| format | Article |
| id | intimal-489 |
| institution | INTI International University |
| institution_category | Local University |
| language | English |
| last_indexed | 2025-11-14T11:51:57Z |
| publishDate | 2016 |
| publisher | Scholars Research Library |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | intimal-4892016-11-24T08:11:01Z http://eprints.intimal.edu.my/489/ Investigation of the electrical properties of metal chalcogenide thin films: A review Ho, Soon Min TA Engineering (General). Civil engineering (General) In the present study, thin films have been successfully prepared by using various deposition methods. The electrical behaviors of obtained thin films were investigated by using Hall Effect measurement and Van Der Pauw technique as reported by many researchers. The experiment results show that the electrical resistivity reduces with increase in temperature and film thickness as well. Scholars Research Library 2016 Article PeerReviewed text en http://eprints.intimal.edu.my/489/1/Investigation%20of%20the%20electrical%20properties%20of%20metal%20chalcogenide%20thin%20films_a%20review.pdf Ho, Soon Min (2016) Investigation of the electrical properties of metal chalcogenide thin films: A review. Der Pharma Chemica, 8 (11). pp. 17-20. ISSN 0975-413X http://derpharmachemica.com/2016-vol-8-issue-11.html |
| spellingShingle | TA Engineering (General). Civil engineering (General) Ho, Soon Min Investigation of the electrical properties of metal chalcogenide thin films: A review |
| title | Investigation of the electrical properties of metal chalcogenide thin films:
A review |
| title_full | Investigation of the electrical properties of metal chalcogenide thin films:
A review |
| title_fullStr | Investigation of the electrical properties of metal chalcogenide thin films:
A review |
| title_full_unstemmed | Investigation of the electrical properties of metal chalcogenide thin films:
A review |
| title_short | Investigation of the electrical properties of metal chalcogenide thin films:
A review |
| title_sort | investigation of the electrical properties of metal chalcogenide thin films:
a review |
| topic | TA Engineering (General). Civil engineering (General) |
| url | http://eprints.intimal.edu.my/489/ http://eprints.intimal.edu.my/489/ http://eprints.intimal.edu.my/489/1/Investigation%20of%20the%20electrical%20properties%20of%20metal%20chalcogenide%20thin%20films_a%20review.pdf |