Investigation of the electrical properties of metal chalcogenide thin films: A review
In the present study, thin films have been successfully prepared by using various deposition methods. The electrical behaviors of obtained thin films were investigated by using Hall Effect measurement and Van Der Pauw technique as reported by many researchers. The experiment results show that the...
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| Format: | Article |
| Language: | English |
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Scholars Research Library
2016
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| Online Access: | http://eprints.intimal.edu.my/489/ http://eprints.intimal.edu.my/489/1/Investigation%20of%20the%20electrical%20properties%20of%20metal%20chalcogenide%20thin%20films_a%20review.pdf |
| Summary: | In the present study, thin films have been successfully prepared by using various deposition methods. The electrical
behaviors of obtained thin films were investigated by using Hall Effect measurement and Van Der Pauw technique
as reported by many researchers. The experiment results show that the electrical resistivity reduces with increase in
temperature and film thickness as well. |
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