Preparation and Characterization of Nickel Oxide Thin Films: A review

Abundant literature is available on the preparation and characterization of metal oxide films as described by many researchers. Generally, physical and chemical deposition techniques could be used to prepare NiO films on various substrates. The obtained films will be studied using different tools...

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Main Author: Ho, Soon Min
Format: Article
Language:English
Published: Research India Publications 2016
Subjects:
Online Access:http://eprints.intimal.edu.my/481/
http://eprints.intimal.edu.my/481/1/Preparation%20and%20Characterization%20of%20Nickel%20Oxide%20Thin%20Films_%20a%20review.pdf
_version_ 1848766486653435904
author Ho, Soon Min
author_facet Ho, Soon Min
author_sort Ho, Soon Min
building INTI Institutional Repository
collection Online Access
description Abundant literature is available on the preparation and characterization of metal oxide films as described by many researchers. Generally, physical and chemical deposition techniques could be used to prepare NiO films on various substrates. The obtained films will be studied using different tools such as xray diffraction, scanning electron microscopy and UV-Visible spectrophotometer in order to determine the best experimental conditions.
first_indexed 2025-11-14T11:51:55Z
format Article
id intimal-481
institution INTI International University
institution_category Local University
language English
last_indexed 2025-11-14T11:51:55Z
publishDate 2016
publisher Research India Publications
recordtype eprints
repository_type Digital Repository
spelling intimal-4812016-11-24T08:25:38Z http://eprints.intimal.edu.my/481/ Preparation and Characterization of Nickel Oxide Thin Films: A review Ho, Soon Min TA Engineering (General). Civil engineering (General) Abundant literature is available on the preparation and characterization of metal oxide films as described by many researchers. Generally, physical and chemical deposition techniques could be used to prepare NiO films on various substrates. The obtained films will be studied using different tools such as xray diffraction, scanning electron microscopy and UV-Visible spectrophotometer in order to determine the best experimental conditions. Research India Publications 2016 Article PeerReviewed text en http://eprints.intimal.edu.my/481/1/Preparation%20and%20Characterization%20of%20Nickel%20Oxide%20Thin%20Films_%20a%20review.pdf Ho, Soon Min (2016) Preparation and Characterization of Nickel Oxide Thin Films: A review. Inernational Journal of Applied Chemistry, 12 (2). pp. 87-93. ISSN 0973-1792 http://www.ripublication.com/Volume/ijacv12n2.htm
spellingShingle TA Engineering (General). Civil engineering (General)
Ho, Soon Min
Preparation and Characterization of Nickel Oxide Thin Films: A review
title Preparation and Characterization of Nickel Oxide Thin Films: A review
title_full Preparation and Characterization of Nickel Oxide Thin Films: A review
title_fullStr Preparation and Characterization of Nickel Oxide Thin Films: A review
title_full_unstemmed Preparation and Characterization of Nickel Oxide Thin Films: A review
title_short Preparation and Characterization of Nickel Oxide Thin Films: A review
title_sort preparation and characterization of nickel oxide thin films: a review
topic TA Engineering (General). Civil engineering (General)
url http://eprints.intimal.edu.my/481/
http://eprints.intimal.edu.my/481/
http://eprints.intimal.edu.my/481/1/Preparation%20and%20Characterization%20of%20Nickel%20Oxide%20Thin%20Films_%20a%20review.pdf