Application of energy dispersive X-ray analysis technique in chalcogenide metal thin films: Review
Thin films have been synthesized in the presence of different precursors using various deposition methods such as chemical bath deposition, electrodeposition and successive ionic layer adsorption and reaction. The obtained thin films could be investigated using energy dispersive X-ray (EDX) techni...
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| Format: | Article |
| Language: | English |
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International Digital Organization for Scientific Information
2016
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| Online Access: | http://eprints.intimal.edu.my/478/ http://eprints.intimal.edu.my/478/1/Application%20of%20energy%20dispersive%20X-ray%20analysis%20technique%20in%20chalcogenide%20metal%20thin%20films_Review.pdf |
| _version_ | 1848766485865955328 |
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| author | Ho, Soon Min |
| author_facet | Ho, Soon Min |
| author_sort | Ho, Soon Min |
| building | INTI Institutional Repository |
| collection | Online Access |
| description | Thin films have been synthesized in the presence of different precursors using various deposition
methods such as chemical bath deposition, electrodeposition and successive ionic layer adsorption and
reaction. The obtained thin films could be investigated using energy dispersive X-ray (EDX) technique in terms
of compositional characterization. Generally, EDX analyzer was equipped with the scanning electron
microscopy as described by many researchers. In this work, the EDX analysis has been carried out in order to
improved quality control and rapid identification of source. |
| first_indexed | 2025-11-14T11:51:54Z |
| format | Article |
| id | intimal-478 |
| institution | INTI International University |
| institution_category | Local University |
| language | English |
| last_indexed | 2025-11-14T11:51:54Z |
| publishDate | 2016 |
| publisher | International Digital Organization for Scientific Information |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | intimal-4782016-11-24T08:02:12Z http://eprints.intimal.edu.my/478/ Application of energy dispersive X-ray analysis technique in chalcogenide metal thin films: Review Ho, Soon Min TA Engineering (General). Civil engineering (General) Thin films have been synthesized in the presence of different precursors using various deposition methods such as chemical bath deposition, electrodeposition and successive ionic layer adsorption and reaction. The obtained thin films could be investigated using energy dispersive X-ray (EDX) technique in terms of compositional characterization. Generally, EDX analyzer was equipped with the scanning electron microscopy as described by many researchers. In this work, the EDX analysis has been carried out in order to improved quality control and rapid identification of source. International Digital Organization for Scientific Information 2016 Article PeerReviewed text en http://eprints.intimal.edu.my/478/1/Application%20of%20energy%20dispersive%20X-ray%20analysis%20technique%20in%20chalcogenide%20metal%20thin%20films_Review.pdf Ho, Soon Min (2016) Application of energy dispersive X-ray analysis technique in chalcogenide metal thin films: Review. Middle-East Journal of Scientific Research, 24 (2). pp. 445-449. ISSN 1990-9233 http://www.idosi.org/mejsr/mejsr24(2)16.htm 10.5829/idosi.mejsr.2016.24.02.22861 |
| spellingShingle | TA Engineering (General). Civil engineering (General) Ho, Soon Min Application of energy dispersive X-ray analysis technique in chalcogenide metal thin films: Review |
| title | Application of energy dispersive X-ray analysis technique in chalcogenide metal thin films: Review |
| title_full | Application of energy dispersive X-ray analysis technique in chalcogenide metal thin films: Review |
| title_fullStr | Application of energy dispersive X-ray analysis technique in chalcogenide metal thin films: Review |
| title_full_unstemmed | Application of energy dispersive X-ray analysis technique in chalcogenide metal thin films: Review |
| title_short | Application of energy dispersive X-ray analysis technique in chalcogenide metal thin films: Review |
| title_sort | application of energy dispersive x-ray analysis technique in chalcogenide metal thin films: review |
| topic | TA Engineering (General). Civil engineering (General) |
| url | http://eprints.intimal.edu.my/478/ http://eprints.intimal.edu.my/478/ http://eprints.intimal.edu.my/478/ http://eprints.intimal.edu.my/478/1/Application%20of%20energy%20dispersive%20X-ray%20analysis%20technique%20in%20chalcogenide%20metal%20thin%20films_Review.pdf |