Application of energy dispersive X-ray analysis technique in chalcogenide metal thin films: Review
Thin films have been synthesized in the presence of different precursors using various deposition methods such as chemical bath deposition, electrodeposition and successive ionic layer adsorption and reaction. The obtained thin films could be investigated using energy dispersive X-ray (EDX) techni...
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| Format: | Article |
| Language: | English |
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International Digital Organization for Scientific Information
2016
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| Online Access: | http://eprints.intimal.edu.my/478/ http://eprints.intimal.edu.my/478/1/Application%20of%20energy%20dispersive%20X-ray%20analysis%20technique%20in%20chalcogenide%20metal%20thin%20films_Review.pdf |
| Summary: | Thin films have been synthesized in the presence of different precursors using various deposition
methods such as chemical bath deposition, electrodeposition and successive ionic layer adsorption and
reaction. The obtained thin films could be investigated using energy dispersive X-ray (EDX) technique in terms
of compositional characterization. Generally, EDX analyzer was equipped with the scanning electron
microscopy as described by many researchers. In this work, the EDX analysis has been carried out in order to
improved quality control and rapid identification of source. |
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