Final Report SIM.EM-S5 Voltage, Current and Resistance Comparison June 2007-October 2009
This is a report of the results of the second Interamerican Metrology System (SIM) comparison on calibration of digital multimeters, performed for strengthening the interaction among National Metrology Institutes (NMIs) and for establishing the degree of equivalence between those laboratories in...
| Main Authors: | , , , , , , , , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IOP Publishing
2014
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| Subjects: | |
| Online Access: | http://eprints.intimal.edu.my/345/ http://eprints.intimal.edu.my/345/1/SIM.EM-S5.pdf |
| _version_ | 1848766454571204608 |
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| author | Sanchez, Harold Cioffi, Jorge Ventura, Rodrigo Ferreira, Vitor Ramos, Rodrigo Martinez, Alexander Montaluisa, Julio Gonzalez, Julio Postigo, Henry Hamilton, Francis Elmquist, Rand Zhang, Nien Fan Izquierdo, Daniel |
| author_facet | Sanchez, Harold Cioffi, Jorge Ventura, Rodrigo Ferreira, Vitor Ramos, Rodrigo Martinez, Alexander Montaluisa, Julio Gonzalez, Julio Postigo, Henry Hamilton, Francis Elmquist, Rand Zhang, Nien Fan Izquierdo, Daniel |
| author_sort | Sanchez, Harold |
| building | INTI Institutional Repository |
| collection | Online Access |
| description | This is a report of the results of the second Interamerican Metrology System (SIM)
comparison on calibration of digital multimeters, performed for strengthening the interaction among
National Metrology Institutes (NMIs) and for establishing the degree of equivalence between those
laboratories in accordance with the CIPM Mutual Recognition Agreement. From June 2007 to
October 2009, four multimeters were used as traveling standards for measurements in eleven
countries, with NIST-USA acting as pilot laboratory. Results for nine measurement points are
presented as errors relative to a comparison reference value together with their uncertainty. |
| first_indexed | 2025-11-14T11:51:24Z |
| format | Article |
| id | intimal-345 |
| institution | INTI International University |
| institution_category | Local University |
| language | English |
| last_indexed | 2025-11-14T11:51:24Z |
| publishDate | 2014 |
| publisher | IOP Publishing |
| recordtype | eprints |
| repository_type | Digital Repository |
| spelling | intimal-3452016-10-05T02:10:38Z http://eprints.intimal.edu.my/345/ Final Report SIM.EM-S5 Voltage, Current and Resistance Comparison June 2007-October 2009 Sanchez, Harold Cioffi, Jorge Ventura, Rodrigo Ferreira, Vitor Ramos, Rodrigo Martinez, Alexander Montaluisa, Julio Gonzalez, Julio Postigo, Henry Hamilton, Francis Elmquist, Rand Zhang, Nien Fan Izquierdo, Daniel TK Electrical engineering. Electronics Nuclear engineering This is a report of the results of the second Interamerican Metrology System (SIM) comparison on calibration of digital multimeters, performed for strengthening the interaction among National Metrology Institutes (NMIs) and for establishing the degree of equivalence between those laboratories in accordance with the CIPM Mutual Recognition Agreement. From June 2007 to October 2009, four multimeters were used as traveling standards for measurements in eleven countries, with NIST-USA acting as pilot laboratory. Results for nine measurement points are presented as errors relative to a comparison reference value together with their uncertainty. IOP Publishing 2014 Article PeerReviewed text en http://eprints.intimal.edu.my/345/1/SIM.EM-S5.pdf Sanchez, Harold and Cioffi, Jorge and Ventura, Rodrigo and Ferreira, Vitor and Ramos, Rodrigo and Martinez, Alexander and Montaluisa, Julio and Gonzalez, Julio and Postigo, Henry and Hamilton, Francis and Elmquist, Rand and Zhang, Nien Fan and Izquierdo, Daniel (2014) Final Report SIM.EM-S5 Voltage, Current and Resistance Comparison June 2007-October 2009. Metrologia, 51. ISSN 1681-7575 10.1088/issn.0026-1394 |
| spellingShingle | TK Electrical engineering. Electronics Nuclear engineering Sanchez, Harold Cioffi, Jorge Ventura, Rodrigo Ferreira, Vitor Ramos, Rodrigo Martinez, Alexander Montaluisa, Julio Gonzalez, Julio Postigo, Henry Hamilton, Francis Elmquist, Rand Zhang, Nien Fan Izquierdo, Daniel Final Report SIM.EM-S5 Voltage, Current and Resistance Comparison June 2007-October 2009 |
| title | Final Report SIM.EM-S5 Voltage, Current and Resistance Comparison June 2007-October 2009 |
| title_full | Final Report SIM.EM-S5 Voltage, Current and Resistance Comparison June 2007-October 2009 |
| title_fullStr | Final Report SIM.EM-S5 Voltage, Current and Resistance Comparison June 2007-October 2009 |
| title_full_unstemmed | Final Report SIM.EM-S5 Voltage, Current and Resistance Comparison June 2007-October 2009 |
| title_short | Final Report SIM.EM-S5 Voltage, Current and Resistance Comparison June 2007-October 2009 |
| title_sort | final report sim.em-s5 voltage, current and resistance comparison june 2007-october 2009 |
| topic | TK Electrical engineering. Electronics Nuclear engineering |
| url | http://eprints.intimal.edu.my/345/ http://eprints.intimal.edu.my/345/ http://eprints.intimal.edu.my/345/1/SIM.EM-S5.pdf |