Conducted Electromagnetic Susceptibility Analysis of Chips Based on BCI Method

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Conducted Electromagnetic Susceptibility Analysis of Chips Based on BCI Method

The bulk current injection (BCI) technique can simulate electromagnetic interference in the environment coupled with the power or signal cables of electronic devices. It is an important method for studying the conducted electromagnetic susceptibility in electromagnetic compatibility. This paper focu...

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Bibliographic Details
Main Authors:	Wen, Zheng, Wai Yie, Leong
Format:	Article
Language:	English English
Published:	INTI International University 2025
Subjects:	T Technology (General) TA Engineering (General). Civil engineering (General) TK Electrical engineering. Electronics Nuclear engineering
Online Access:	http://eprints.intimal.edu.my/2165/ http://eprints.intimal.edu.my/2165/1/ij2025_23.pdf http://eprints.intimal.edu.my/2165/2/712

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