Wen, Z., & Wai Yie, L. (2025). Conducted Electromagnetic Susceptibility Analysis of Chips Based on BCI Method. INTI International University.
Chicago Style (17th ed.) CitationWen, Zheng, and Leong Wai Yie. Conducted Electromagnetic Susceptibility Analysis of Chips Based on BCI Method. INTI International University, 2025.
MLA (9th ed.) CitationWen, Zheng, and Leong Wai Yie. Conducted Electromagnetic Susceptibility Analysis of Chips Based on BCI Method. INTI International University, 2025.
Warning: These citations may not always be 100% accurate.